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Proceedings Paper

Research on the phase unwrapping theory of the surface roughness measurement system based on LabVIEW
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Paper Abstract

The roughness of the surface is an important parameter that reflects the quality of the object. Optical methods are the usual ways to measure the surface roughness including scattering method, speckle method, interferometric method and optical stylus method. But they are highly required the precision of the mechanism and they are not convenient to realize the automatic measurement. To improve the structure and the automatic performance, this surface roughness measurement system is based on the theory of two-dimensional phase unwrapping that is widely used in aerophotogrammetry. With the theory, the three dimensional data can be calculated from the images detected. The difference is that the image is captured by radar in aerophotogrammetrytly while it is got by using optical structure in this system. The images are got through the optical structure with the structured light. To control the phase of the light, the gratings is used in the system controlled by the piezoelectric ceramics. The phase information is contained in the image and captured by the CCD camera. To analyze the images captured through the optical system, the phase should be extracted from the images through complex operation to generate the phase map. The quality-guided algorithm is the main algorithm in this system. LabVIEW is the main software development environment and the massive calculation is accomplished in the dynamic linked library complied by Visual C++ to realize the image processing. Through the stereogram showed in the software we can clearly get the three dimensional information of the surface.

Paper Details

Date Published: 28 January 2009
PDF: 8 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715621 (28 January 2009); doi: 10.1117/12.806918
Show Author Affiliations
Lei Zhong, Univ. of Shanghai for Science and Technology (China)
Xiang-ning Li, Univ. of Shanghai for Science and Technology (China)
Zhong-he Huang, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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