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Proceedings Paper

Determination of atmospheric pressure loading coefficient in Changchun SLR station
Author(s): You Zhao; Sok Jong; Yong Chol Pak; Kuk Song Ryu; Cunbo Fan; Xingwei Han
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Paper Abstract

The atmospheric pressure loading coefficient describing the effect of air pressure loading on the site coordinates is one of the important factors arising in the precise coordinate determination by modern space geodetic techniques such as VLBI, SLR, GPS and so on. This paper deals with the calculation of the atmospheric pressure loading coefficient of Changchun SLR station by means of a simple empirical approach using 5 years (2001-2005) observation data, and analysis of the pressure loading effect on the station height. The 5-year averaging loading coefficient was estimated to be about -0.5 mm/hPa, and the result indicates that, like the other stations, Changchun station coordinates, especially the vertical component has a close relation with local atmospheric pressure, being very sensitive to atmospheric pressure loading effect. Also analyzed in this paper is the atmospheric "blue sky" effect on the Changchun SLR station height on the basis of the loading coefficient estimates.

Paper Details

Date Published: 3 February 2009
PDF: 5 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600J (3 February 2009); doi: 10.1117/12.806892
Show Author Affiliations
You Zhao, Changchun Observatory, National Astronomical Observatories (China)
Sok Jong, Pyongyang Astronomical Observatory, The State Academy of Sciences of DPR of Korea (Korea, Republic of)
Yong Chol Pak, Pyongyang Astronomical Observatory, The State Academy of Sciences of DPR of Korea (Korea, Republic of)
Kuk Song Ryu, Pyongyang Astronomical Observatory, The State Academy of Sciences of DPR of Korea (Korea, Republic of)
Cunbo Fan, Changchun Observatory, National Astronomical Observatories (China)
Xingwei Han, Changchun Observatory, National Astronomical Observatories (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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