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Proceedings Paper

Phase interrogation of a planar integrated refractive index sensor
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Paper Abstract

A novel theoretical scheme is presented for a surface plasmon-polariton (SPP) planar refractive index sensor based on one of the simplest integrated optical devices available, the Mach-Zehnder interferometer (MZI), to monitor relative phase variations in waveguides. An SPP is excited with the Bragg grating imprinted into core and buffer layers of one of the arms of the MZI. The main principle of operation of this device is based on the large phase change of the waveguide mode transmitted through the grating during the SPP excitation caused by the change in the refractive index of the sensed layer in contact with the SPP supporting metal layer.

Paper Details

Date Published: 12 August 2008
PDF: 5 pages
Proc. SPIE 7099, Photonics North 2008, 709926 (12 August 2008); doi: 10.1117/12.806853
Show Author Affiliations
Galina Nemova, École Polytechnique de Montréal (Canada)
Andrei V. Kabashin, École Polytechnique de Montréal (Canada)
Raman Kashyap, École Polytechnique de Montréal (Canada)


Published in SPIE Proceedings Vol. 7099:
Photonics North 2008

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