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Proceedings Paper

Optimal design of optical fiber fluorescent thermometry
Author(s): Danping Jia; Ting Jia; Lu Gao; Yingwen Lin
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Paper Abstract

It is proved that most of the actual fluorescent decays contain non-exponential component. An instability factor is defined to express the goodness of the actual fluorescent decay using in thermometer. The principle of mathematical model established in a fluorescent decay thermometer is discussed. It is critical to establish an accurate mathematical model in temperature measurement based on fluorescent decay, a good mathematical model is the one which is consistent with physical reality. If short of such consistence The traditional single-exponential model would induce much error in higher level precision temperature measurement for it's only a theoretical assumption. A cutting and normalized method and an instability factor are defined to judge the influence of non-exponential deflection of the fluorescent decay curve. The principle of establishing a mathematical model is discussed. Its pointed out that the matching of the mathematical model and the data processing method are essentially important for the measurement, the deducing conclusions such as data processing precisions, experimental and simulation results are uncertainty as applying to actual fluorescent material. Prony method having the potential capability in dealing with multi-exponential decay model also is pointed out. The above conclusions are evaluated by computer simulations and experiments.

Paper Details

Date Published: 27 January 2009
PDF: 9 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715609 (27 January 2009); doi: 10.1117/12.806808
Show Author Affiliations
Danping Jia, Shenyang Univ. of Technology (China)
Ting Jia, Shenyang Univ. of Technology (China)
Lu Gao, Shenyang Univ. of Technology (China)
Yingwen Lin, Shenyang Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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