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Proceedings Paper

Development of a near infrared spectroscopy analyzer for on-line process analysis
Author(s): Huajun Ye; Lipeng Liu; Alin Xia; Xuefeng Zhang; Jian Wang
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Paper Abstract

An on-line near infrared analytical system was developed for on-line process analysis applications. The system includes a near infrared spectroscopy analyzer and accessories (fibers, flow cell, diffuse reflection probes etc.). Its features and configuration were described in detail. Good performance was acquired: the wavelength range, resolution and stray light of spectra are 1000nm~2500nm, less than 5nm and less than 0.1%, respectively; the repeatability and uncertainty tolerances of wavelength are less than 0.02nm and 0.1nm, respectively; the temperature-induced drift of wavelength is less than 0.05nm/°C the slope and intercept ranges are 0.98~1.00 and -0.02~0.01 for photometric linearity, respectively; spectrophotometric noise is 1.3×10-5 (RMS) for high-light flux and 7.0×10-5 (RMS) for low-light flux. The above performance parameters of the analyzer meet and exceed the requirement of USP1119. Furthermore, the analyzer has been successfully applied to the laboratory, petrochemical factory and sugar mill. A Partial Least Squares (PLS) calibration model constructed from laboratory and factory samples was used for these applications. The application result reveals that the analyzer can meet all requirements. All results demonstrate that the analyzer has the merits of fast time response, excellent modeling, high accuracy and low maintenance cost and can deal with complex industrial environment.

Paper Details

Date Published: 3 February 2009
PDF: 9 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601W (3 February 2009); doi: 10.1117/12.806792
Show Author Affiliations
Huajun Ye, Hangzhou Dianzi Univ. (China)
Focused Photonics, Inc. (China)
Lipeng Liu, Focused Photonics, Inc. (China)
Alin Xia, Hangzhou Dianzi Univ. (China)
Xuefeng Zhang, Focused Photonics, Inc. (China)
Jian Wang, Hangzhou Dianzi Univ. (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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