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Proceedings Paper

A survey of modeling methods for analog circuit testability analysis
Author(s): Xiaomei Chen; Xiaofeng Meng; Bo Zhong; Hong Ji
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Paper Abstract

Analog signal circuit is the necessary component of modern electronic products. The research on the testability of analog signal circuit becomes the highlighted topic. In this paper, the modeling types are first discussed, then several different testability analysis based on different modeling methods are systematically summarized and explained, which includes numerical analysis method, symbolic analysis method, pole-zero analysis method, TTF method, CCM method, DES method, single dependency method, multi-signal method. As for every method, the basic idea, the research status, the practice and application instances, and the advantage/disadvantage are involved. At last, the future research topics are predicted.

Paper Details

Date Published: 13 October 2008
PDF: 9 pages
Proc. SPIE 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence, 71272K (13 October 2008); doi: 10.1117/12.806750
Show Author Affiliations
Xiaomei Chen, Beihang Univ. (China)
North China Electric Power Univ. (China)
Xiaofeng Meng, Beihang Univ. (China)
Bo Zhong, Beihang Univ. (China)
Hong Ji, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 7127:
Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence

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