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Proceedings Paper

Noise analysis for infrared focal plane arrays CMOS readout integrated circuit
Author(s): Jiamu Lin; Ruijun Ding; Honglei Chen; Xiao Shen; Fei Liu
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Paper Abstract

With the development of the infrared focal plane detectors, the internal noises in the infrared focal plane arrays (IRFPAs) CMOS readout integrated circuit gradually became an important factor of the development of the IRFPAs. The internal noises in IRFPAs CMOS readout integrated circuit are researched in this work. Part of the motivation for this work is to analyze the mechanism and influence of the internal noises in readout integrated circuit. And according to the signal transporting process, many kinds of internal noises are analyzed. According to the results of theory analysis, it is shown that 1/f noise, KTC noise and pulse switch noise have greater amplitude in frequency domain. These noises have seriously affected the performance of output signal. Also this work has frequency test on the signals of a readout integrated circuit chip which is using DI readout mode. After analyzing the frequency test results, it is shown that 1/f noises and pulse switch noises are the main components of the internal noises in IRFPAS CMOS readout integrated circuit and they are the noises which give a major impact to the output signal. In accordance with the type of noise, some design methods for noise suppression are put forward. And after the simulation of these methods with EDA software, the results show that noises have been reduced. The results of this work gave the referenced gist for improving the noise suppression design of IRFPAs CMOS readout integrated circuit.

Paper Details

Date Published: 9 February 2009
PDF: 8 pages
Proc. SPIE 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration, 71580C (9 February 2009); doi: 10.1117/12.806709
Show Author Affiliations
Jiamu Lin, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Ruijun Ding, Shanghai Institute of Technical Physics (China)
Honglei Chen, Shanghai Institute of Technical Physics (China)
Xiao Shen, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Fei Liu, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 7158:
2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration

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