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Proceedings Paper

Dual-frequency green laser interferometer based on a frequency stabilized 543.5nm Zeeman He-Ne laser
Author(s): Jing Lei; Juqun Yan; Nanhai Song
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Paper Abstract

A dual-frequency laser interferometer is established based on a frequency-stabilized 543.5nm Zeeman He-Ne laser. The interferometer has been tested in displacement measuring experiments in comparison with a commercial 632.8nm dualfrequency laser interferometer. Test results show that the achieved stability and the accuracy of the dual-frequency green laser interferometer have reached the level in commercial dual-frequency interferometers. Apart from being capable in heterodyne interferometry as a single-wavelength interferometer, the 543.5nm dual-frequency interferometer is also promising in two-wavelength interferometry when combined with the commercial 632.8nm dual-frequency interferometer, where both a high resolution and a relatively large range in displacement measurement can be achieved.

Paper Details

Date Published: 3 February 2009
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601T (3 February 2009); doi: 10.1117/12.806697
Show Author Affiliations
Jing Lei, Tsinghua Univ. (China)
Juqun Yan, Tsinghua Univ. (China)
Nanhai Song, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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