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Proceedings Paper

A new method for fault feature extraction of analog circuit
Author(s): Qingjian Hou; Hongli Wang
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Paper Abstract

The feature extraction is one of key steps in fault diagnosis. A method of least square support vector machine (LSSVM) is put forward based on genetic optimization to restrain the end effect of empirical mode decomposition (EMD). Based on the method, a method of feature extraction is put forward. The energy of intrinsic mode functions (IMF) generated from EMD is to be the feature to distinguishing faults. The result of feature extraction experiment of analog circuit shows that the method is effective.

Paper Details

Date Published: 13 October 2008
PDF: 7 pages
Proc. SPIE 7128, Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment, 71280K (13 October 2008); doi: 10.1117/12.806551
Show Author Affiliations
Qingjian Hou, Xi’an Research Institute of High Technology (China)
Hongli Wang, Xi’an Research Institute of High Technology (China)


Published in SPIE Proceedings Vol. 7128:
Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment

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