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Proceedings Paper

Scattering performance analysis of reflectance photometer for quantifying gold labeled test strips
Author(s): Lihua Huang; Youbao Zhang; Chengke Xie; Jianfeng Qu; Huijie Huang; Xiangzhao Wang
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Paper Abstract

Gold labeled immunochromatography assay is widely used in many fields. Quantitative test can be realized by using a reflectance photometer. However, theoretical analysis of the strip and the photometer has seldom been reported. In this paper, the microstructure of immunochromatographic strip labeled by nanogold particles is analyzed with scanning electron microscope (SEM). Based on the SEM images of the strip, Mie's scattering theory is used to investigate the scattering behaviors of particles in the strip, and Lambert cosine law is applied to analyze the diffuse reflection of porous strip. Besides, a reflectance photometer for gold labeled test strip has been developed for fast quantification of immunochromatography assay in our group. Theoretical model is achieved by introducing the parameter of the developed reflectance photometer. The calculated scattering signal distribution is well consistent with that measured by the reflectance photometer.

Paper Details

Date Published: 28 January 2009
PDF: 9 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561O (28 January 2009); doi: 10.1117/12.806529
Show Author Affiliations
Lihua Huang, Shanghai Institute of Optics and Fine Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Youbao Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Chengke Xie, Shanghai Institute of Optics and Fine Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Jianfeng Qu, Shanghai Institute of Optics and Fine Mechanics (China)
Huijie Huang, Shanghai Institute of Optics and Fine Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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