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Proceedings Paper

A new behavioral modeling approach for digital I/O ports
Author(s): Jian-guo Shen; Min-lan Jiang; Qinggen Zheng; Yushun Guo
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Paper Abstract

This paper addresses a new and efficient behavioral modeling method of digital I/O ports for EMC and signal integrity simulations. The proposed modeling methodology is based on the fuzzy logic system from port voltage and current transient waveforms. The obtained models can be implemented as SPICE subcircuit conveniently and their accuracy and efficiency are verified by applying to the approach to the characterization of transistor -level models of actual devices.

Paper Details

Date Published: 13 October 2008
PDF: 6 pages
Proc. SPIE 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence, 71271P (13 October 2008); doi: 10.1117/12.806442
Show Author Affiliations
Jian-guo Shen, Zhejiang Normal Univ. (China)
Min-lan Jiang, Zhejiang Normal Univ. (China)
Qinggen Zheng, Zhejiang Normal Univ. (China)
Yushun Guo, Hangzhou Dianzi Univ. (China)


Published in SPIE Proceedings Vol. 7127:
Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence

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