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Proceedings Paper

The exploration of the characteristics of the hyperglycemia serum fluorescence spectrum
Author(s): Lexin Wang; Zhimin Zhao; Hui Chen; Peng Li; Yujun Xin
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Paper Abstract

Now, spectra technology is widely used in the biomedicine research,so this study investigates variation of the fluorescence spectra in different excitation wavelength, and the spectra of serum with different glucose concentration is tested in the excitation wavelength of 240nm to 280nm. The experimental result shows that the correlation between the serum fluorescence intensity and the excitation light is very close, when the excitation light is in the ultraviolet wave band, the fluorescence of serum is intensive. There is a violent fluorescence emission wavelength, which is 300nm to 410nm, while the excitation wavelength ranges from 220nm to 290nm, and the peaks wavelength are 330nm and 370nm. From 240nm to 280nm, the serum fluorescence intensity increases synchronously with the glucose concentration, and the relationship between the fluorescence peak wavelength and the glucose concentration is almost in line. In this way the blood sugar concentration can be estimated by the fluorescence spectra peak wavelength when the excitation wavelength is from 240nm to 280nm, which is effective. It provides experimental foundation for the wide use of spectra technology in medical diagnose, and the effectiv method to test the blood sugar concentration.

Paper Details

Date Published: 3 February 2009
PDF: 7 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601M (3 February 2009); doi: 10.1117/12.806410
Show Author Affiliations
Lexin Wang, Heilongjiang August First Land Reclamation Univ. (China)
Nanjing Univ. of Aeronautics and Astronautics (China)
Zhimin Zhao, Nanjing Univ. of Aeronautics and Astronautics (China)
Hui Chen, Nanjing Univ. of Aeronautics and Astronautics (China)
Peng Li, Nanjing Univ. of Aeronautics and Astronautics (China)
Yujun Xin, Nanjing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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