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Proceedings Paper

Research of optical coherence tomography microscope based on CCD detector
Author(s): Hua Zhang; Zhongbao Xu; Shuomo Zhang
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Paper Abstract

The reference wave phase was modulated with a sinusoidal vibrating mirror attached to a Piezoelectric Transducer (PZT), the integration was performed by a CCD, and the charge storage period of the CCD image sensor was one-quarter period of the sinusoidal phase modulation. With the frequency- synchronous detection technique, four images (four frames of interference pattern) were recorded during one period of the phase modulation. In order to obtain the optimum modulation parameter, the values of amplitude and phase of the sinusoidal phase modulation were determined by considering the measurement error caused by the additive noise contained in the detected values. The PZT oscillation was controlled by a closed loop control system based on PID controller. An ideal discrete digital sine function at 50Hz with adjustable amplitude was used to adjust the vibrating of PZT, and a digital phase shift techniques was used to adjust vibrating phase of PZT so that the phase of the modulation could reach their optimum values. The CCD detector was triggered with software at 200Hz. Based on work above a small coherent signal masked by the preponderant incoherent background with a CCD detector was obtained.

Paper Details

Date Published: 28 January 2009
PDF: 8 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71561K (28 January 2009); doi: 10.1117/12.806126
Show Author Affiliations
Hua Zhang, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering of Hubei Province (China)
Zhongbao Xu, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering of Hubei Province (China)
Shuomo Zhang, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering of Hubei Province (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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