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Proceedings Paper

Characterization and system modeling of M-pixel CMOS arrays part II
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Paper Abstract

This paper is a follow-up to the paper presented at SPIE Electronic Imaging Science and Technology in San Jose, 2007, "Characterization and system modeling of a 5-Mpixel CMOS array." We expand and refined test methodologies used in the characterization and selection process of CMOS arrays targeting megapixel security camera applications. This paper presents work in the following areas: system gain, gain noise, binning noise, F-number response, system modeling, and temperature effects. Since security cameras must operate under harsh temperature extremes, performance under these conditions must be understood. Characterizations are made for the following areas: dark current, DSNU, hot pixels, clusters, temporal noise and spatial noise.

Paper Details

Date Published: 28 January 2009
PDF: 13 pages
Proc. SPIE 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 72490M (28 January 2009); doi: 10.1117/12.805931
Show Author Affiliations
Curtis Tesdahl, Pelco Corp. (United States)
Prateek Jain, Pelco Corp. (United States)
David Dorn, Pelco Corp. (United States)


Published in SPIE Proceedings Vol. 7249:
Sensors, Cameras, and Systems for Industrial/Scientific Applications X
Erik Bodegom; Valérie Nguyen, Editor(s)

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