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Proceedings Paper

Terahertz wave two-dimensional transmission imaging with a backward wave oscillator
Author(s): Hongyang Yuan; Xinhao Ge; Cunlin Zhang
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Paper Abstract

We present a terahertz (THz) imaging system with a Backward Wave Oscillator (BWO). BWO Continuous-Wave THz imaging is a new approach to non-destructive testing. Many materials that are opaque to visible and infrared light are transparent to THz radiation. THz wave image provides a higher spatial resolution than microwave image by having much shorter wavelength. It also poses no known harm to living organisms, making it a safe and powerful imaging technology. Unlike pulsed THz imaging, BWO THz imaging only yields intensity data without providing any depth, frequency-domain or time-domain information about the subject. However, in most cases the energy plots are sufficient for identification of targets. In exchange for the loss of depth, time-domain and frequency-domain information, BWO imaging offers a simple, fast and relatively low-cost system. In this work we show a simple Terahertz (THz) 2-dimentional scanning imaging system utilizing a BWO source tunable from 0.52 to 0.71 THz and a pyroelectric sensor detector operated in THz range. The sample is placed on an X-Z two-dimensional stage controlled by a computer. The intensity information of the terahertz wave after passing sample is collected. Two-dimensional image of the sample is obtained by raster scanning the sample in X and Z directions. A number of potential imaging applications are demonstrated using the 0.71 THz radiation, including nondestructive real-time testing for campus debit card and various articles contained in an envelop. And we present the digital image processing based on the result of the imaging system. This work reveals that a BWO THz imaging system is very practical, effective and promising in nondestructive identification and security inspections applications in future.

Paper Details

Date Published: 9 February 2009
PDF: 5 pages
Proc. SPIE 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration, 71580T (9 February 2009); doi: 10.1117/12.805633
Show Author Affiliations
Hongyang Yuan, Capital Normal Univ. (China)
Xinhao Ge, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)

Published in SPIE Proceedings Vol. 7158:
2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration

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