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Proceedings Paper

The lowest sampling frequency not existing in theory
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Paper Abstract

It was demonstrated that the lowest sampling frequency fmin_sample doesn't exist in mathematics. With mathematical analysis, the principles of sampling and reconstructing a continuous signal were strictly calculated. We found that the spectra of sampling data at critical sampling frequency fcritical_sample should overlap at the highest frequency fmax of the continuous signal. The fcritical_sample was defined as double of the fmax, viz. fcritical_sample=2fmax. As we know, the reconstructed signal will be distorted with this kind of overlapped spectra. Here, we will further illustrate the theoretical results. Aided with Fast Fourier Transform(FFT), the critical sampling and the process reconstructing continuous-time signal from it were discussed by spectroscopy. A symmetrical frequency-limited spectrum F(ω) was constructed with three modified rise-cosine pulses. Its corresponding time-domain signal f(t) was worked out theoretically. f(t) was sampled with δT(t). By modifying T, the critical sampling signal was obtained. With FFT, the spectrum Fd(ω)of the sampling signal was figured out. The calculated Fd(ω) was compared with the constructed F(ω), and was analyzed for observing frequency alias. A cycle of Fd(ω) for restoring the continuous signal could be obtained when Fd(ω) was filtered by an ideal low-passed filter. With FFT, a continuous signal was reconstructed from it. As the results, the spectra of sampling data at the fcritical_sampleoverlapped at the fmax. The reconstructed signal distorted obviously. So, the lowest sampling frequency fmin_sample doesn't exist. The sampling theorem couldn't include equal sign. It is unscientific to say that the f min_sample equal to double of the fmax.

Paper Details

Date Published: 3 February 2009
PDF: 9 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601G (3 February 2009); doi: 10.1117/12.805614
Show Author Affiliations
Yizhong Song, Nanjing Univ. of Aeronautics and Astronautics (China)
Dezhou Univ. (China)
Zhimin Zhao, Nanjing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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