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Proceedings Paper

Hybrid regularization restoration for adaptive optics image
Author(s): Bo Chen; Ze-xun Geng; Jun Shen; Yang Yang
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Paper Abstract

The performance of high-resolution imaging with large optical instruments is severely limited by atmospheric turbulence. Adaptive optics (AO) offers a real-time compensation for turbulence. However, the correction is often only partial, and image restoration is required for reaching or nearing to the diffraction limit. In this paper, we consider a hybrid Curvelet-Fourier regularized deconvolution (HCFRD) scheme for use in image restoration problems. The HCFRD algorithm performs noise regularization via scalar shrinkage in both the Fourier and Curvelet domains. The Fourier shrinkage exploits the Fourier transform's economical representation of the colored noise inherent in deconvolution, whereas the curvelet shrinkage exploits the curvelet domain's economical representation of piecewise smooth signals and images. We derive the optimal balance between the amount of Fourier and Curvelet regularization by optimizing an approximate mean-squared error (MSE) metric and find that signals with more economical curvelet representations require less Fourier shrinkage. HCFRD is applicable to all ill-conditioned deconvolution problems, its estimate features minimal ringing, unlike the purely Fourier-based Wiener deconvolution. Experimental results prove that HCFRD outperforms the Wiener filter and ForWaRD algorithm in terms of both visual quality and SNR performance.

Paper Details

Date Published: 3 February 2009
PDF: 10 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716003 (3 February 2009); doi: 10.1117/12.804857
Show Author Affiliations
Bo Chen, Guilin Air Force Academy (China)
Zhengzhou Institute of Surveying and Mapping (China)
Ze-xun Geng, Zhengzhou Institute of Surveying and Mapping (China)
Jun Shen, Guilin Air Force Academy (China)
Yang Yang, Guilin Air Force Academy (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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