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Proceedings Paper

A comprehensive model of catastrophic optical-damage in broad-area laser diodes
Author(s): A. K. Chin; R. K. Bertaska; M. A. Jaspan; A. M. Flusberg; S. D. Swartz; M. T. Knapczyk; R. Petr; I. Smilanski; J. H. Jacob
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Paper Abstract

The present model of formation and propagation of catastrophic optical-damage (COD), a random failure-mode in laser diodes, was formulated in 1974 and has remained substantially unchanged. We extend the model of COD phenomena, based on analytical studies involving EBIC (electron-beam induced current), STEM (scanning transmission-electron microscopy) and sophisticated optical-measurements. We have determined that a ring-cavity mode, whose presence has not been previously reported, significantly contributes to COD initiation and propagation in broad-area laser-diodes.

Paper Details

Date Published: 24 February 2009
PDF: 16 pages
Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71981A (24 February 2009); doi: 10.1117/12.804834
Show Author Affiliations
A. K. Chin, Aland Chin, LLC (United States)
R. K. Bertaska, New England Analytical, LLC (United States)
M. A. Jaspan, Science Research Lab., Inc. (United States)
A. M. Flusberg, Science Research Lab., Inc. (United States)
S. D. Swartz, Science Research Lab., Inc. (United States)
M. T. Knapczyk, Science Research Lab., Inc. (United States)
R. Petr, Science Research Lab., Inc. (United States)
I. Smilanski, Science Research Lab., Inc. (United States)
J. H. Jacob, Science Research Lab., Inc. (United States)


Published in SPIE Proceedings Vol. 7198:
High-Power Diode Laser Technology and Applications VII
Mark S. Zediker, Editor(s)

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