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Proceedings Paper

Multilayer waveguide structures investigated by the generalized m-line spectroscopy
Author(s): Elzbieta Augusciuk
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Paper Abstract

Parameters of a waveguide may be investigated with great resolution by using the m-line spectroscopy method. By depositing successive layers on the waveguide the propagation conditions of the structure may be changed. In this paper investigations of multilayer waveguide structures by the generalized m-line spectroscopy method have been presented. Multilayer waveguide structure is constructed by depositing successive layers on gradient index waveguide performed in glass by the ion-exchange method. The depositing layers are optimally selected in order to estimate their refractive indices, thicknesses and other parameters.

Paper Details

Date Published: 13 June 2008
PDF: 5 pages
Proc. SPIE 7120, Optical Fibers and Their Applications 2008, 71200J (13 June 2008); doi: 10.1117/12.804521
Show Author Affiliations
Elzbieta Augusciuk, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 7120:
Optical Fibers and Their Applications 2008
Jan Dorosz; Ryszard S. Romaniuk; Tomasz R. Wolinski, Editor(s)

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