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Proceedings Paper

System for detection of small inclusions in large optics
Author(s): J. Wolfe; M. Runkel
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Paper Abstract

The presence of defects in optical materials can lead to bulk damage or downstream modulation and subsequent surface damage in high fluence laser systems. An inclusion detection system has been developed by the National Ignition Facility Optics Metrology Group. The system detects small inclusions in optical materials with increased sensitivity and speed over previous methods. The system has detected all known inclusions and defects and has detected previously undetected defects smaller than 5 microns.

Paper Details

Date Published: 30 December 2008
PDF: 9 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320W (30 December 2008); doi: 10.1117/12.804456
Show Author Affiliations
J. Wolfe, Lawrence Livermore National Lab. (United States)
M. Runkel, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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