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Proceedings Paper

Laser damage growth in fused silica with simultaneous 351nm and 1053nm irradiation
Author(s): Mary A. Norton; Adra V. Carr; C. Wren Carr; Eugene E. Donohue; Michael D. Feit; William G. Hollingsworth; Zhi Liao; Raluca A. Negres; Alexander M. Rubenchik; P. J. Wegner
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Paper Abstract

Laser-induced growth of optical damage often determines the useful lifetime of an optic in a high power laser system. We have extended our previous work on growth of laser damage in fused silica with simultaneous 351 nm and 1053 nm laser irradiation by measuring the threshold for growth with various ratios of 351 nm and 1053 nm fluence. Previously we reported that when growth occurs, the growth rate is determined by the total fluence. We now find that the threshold for growth is dependent on both the magnitude of the 351 nm fluence as well as the ratio of the 351 nm fluence to the 1053 nm fluence. Furthermore, the data suggests that under certain conditions the 1053 nm fluence does not contribute to the growth.

Paper Details

Date Published: 30 December 2008
PDF: 8 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71321H (30 December 2008); doi: 10.1117/12.804432
Show Author Affiliations
Mary A. Norton, Lawrence Livermore National Lab. (United States)
Adra V. Carr, Lawrence Livermore National Lab. (United States)
C. Wren Carr, Lawrence Livermore National Lab. (United States)
Eugene E. Donohue, Lawrence Livermore National Lab. (United States)
Michael D. Feit, Lawrence Livermore National Lab. (United States)
William G. Hollingsworth, Lawrence Livermore National Lab. (United States)
Zhi Liao, Lawrence Livermore National Lab. (United States)
Raluca A. Negres, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)
P. J. Wegner, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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