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Proceedings Paper

Pulse compression gratings for the PETAL project: a review of various technologies
Author(s): Jérôme Néauport; Nicolas Bonod
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Paper Abstract

A Petawatt facility called PETAL (PETawatt Aquitaine Laser) is under development near the LIL (Ligne d'Integration Laser) at CEA Cesta, France. PETAL facility uses chirped pulse amplification (CPA) technique. We herein review various studies made to develop pulse compression gratings for CPA application with high laser induced damaged threshold. Different multilayer dielectric (MLD) gratings have been manufactured to exhibit different electric field maximum values in the pillars of the grating. A damage testing facility operating at 1.053μm, 500fs pulse duration is used to damage test the parts manufactured from these designs. It is evidenced that for fixed incidence and materials the damage of the grating is directly related to the electric field intensity maximum in the material, which depends on the groove profile. Laser induced damage thresholds of 5 J/ cm2 is experimentally reached with very high and uniform efficiencies. New structures are currently under study, gratings with mixed metal/dielectric layers MLD or more exotic 2D and 3D photonic crystals devices. For each case, we detail the design and expected performances. We also give some diffraction efficiency and laser damage measurements when samples were manufactured.

Paper Details

Date Published: 7 January 2009
PDF: 9 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320D (7 January 2009); doi: 10.1117/12.804413
Show Author Affiliations
Jérôme Néauport, CEA CESTA (France)
Nicolas Bonod, Institut Fresnel, CNRS, Domaine Univ. de Saint Jérôme (France)


Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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