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Proceedings Paper

Plasmon-enhanced luminescence from nanocrystalline SiC films through adjusting spacer layer thickness
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Paper Abstract

We report the photoluminescence enhancement of nc-SiC films by coating nanostructure Ag films and study the influences of surface plasmon on photoluminescence properties by varying spacer thickness. PL curves of the samples deposited with different thickness of α-SiNx present two PL peaks which are contributed to the interference in the films and surface plasmon resonance, respectively. The PL intensity of the sample coated with Ag film is quenched due to combination of Forster nonradiative process and coherent photonic mode reduction in nc-SiC films, while the PL intensity of the samples with inserted spacer α-SiNx is enhanced because of the surface plasmon resonance.

Paper Details

Date Published: 18 November 2008
PDF: 7 pages
Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71354E (18 November 2008); doi: 10.1117/12.804354
Show Author Affiliations
Wei Yu, Hebei Univ. (China)
Jing Yu, Hebei Univ. (China)
Wanbing Lu, Hebei Univ. (China)
Yalan Bian, Hebei Univ. (China)
Chunsheng Wang, Hebei Univ. (China)
Guangsheng Fu, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 7135:
Optoelectronic Materials and Devices III
Yi Luo; Jens Buus; Fumio Koyama; Yu-Hwa Lo, Editor(s)

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