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Proceedings Paper

Study of active width-reduced line-defect photonic crystal waveguides for high speed applications
Author(s): Yongbo Tang; Bowen Wang
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Paper Abstract

We study the electrical and optical characteristic of the width-reduced line-defect photonic crystal waveguides with lateral p-i-n structures on Silicon-on-Insulator substrates. A longitudinal-section-based electrical model is built to take the holes into consideration. Compared with the classical line-defect photonic crystal waveguides, the width reduced photonic crystal waveguide has much stronger capacity in optical confinement in plane, which can allow a narrower intrinsic layer that leads to a fast electric response.

Paper Details

Date Published: 18 November 2008
PDF: 8 pages
Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71350R (18 November 2008); doi: 10.1117/12.804275
Show Author Affiliations
Yongbo Tang, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)
Bowen Wang, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7135:
Optoelectronic Materials and Devices III
Yi Luo; Jens Buus; Fumio Koyama; Yu-Hwa Lo, Editor(s)

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