Share Email Print
cover

Proceedings Paper

Time-resolved imaging of material response during laser-induced bulk damage in SiO2
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report on time resolved imaging of the dynamic events taking place during laser-induced damage in the bulk of fused silica samples with nanosecond temporal resolution and one micron spatial resolution. These events include: shock/pressure wave formation and propagation, transient absorption, crack propagation and formation of residual stress fields. The work has been performed using a time-resolved microscope system that utilizes a probe pulse to acquire images at delay times covering the entire timeline of a damage event. Image information is enhanced using polarized illumination and simultaneously recording the two orthogonal polarization image components. For the case of fused silica, an electronic excitation is first observed accompanied by the onset of a pressure wave generation and propagation. Cracks are seen to form early in the process and reach their final size at about 25 ns into the damage event. In addition, changes that in part are attributed to transient absorption in the modified material are observed for delays up to about 200 microseconds.

Paper Details

Date Published: 30 December 2008
PDF: 10 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320Q (30 December 2008); doi: 10.1117/12.804245
Show Author Affiliations
S. G. Demos, Lawrence Livermore National Lab. (United States)
R. A. Negres, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top