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Proceedings Paper

Increased laser damage threshold by protecting and cleaning optics using first contact polymer stripcoatings: preliminary data
Author(s): Eric S. Bailey; Nicholas R. Confer; Vanessa Lutzke; Dana Drochner; Kyle Vircks; James P. Hamilton
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Paper Abstract

Statistically based Laser Damage Testing (LDT) was performed on clean, polished silicon wafers before and after First Contact Polymer was applied and removed. Polymer removal results in surfaces that are nearly atomically clean as evidenced by XPS data and may be a starting basis for developing an LDT based surface cleanliness test. A LabView controlled nanosecond YAG based LDT system with motion control stages was built and used to demonstrate significant difference in surface laser damage threshold following cleaning of already "clean" surfaces. These initial results represent the beginning of a systematic study on a variety of surfaces to include glass, silicon, germanium, coatings and nonlinear optical crystals as well as diffraction gratings. Recent independent testing lab results demonstrate YAG laser damage thresholds after polymer removal, indistinguishable from that of new high power laser optics, on coated BK7 of 15J/cm2 at 20ns and 20Hz. Our initial data indicate a significant increase, as much as 10% in LDT post cleaning.

Paper Details

Date Published: 30 December 2008
PDF: 8 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71321M (30 December 2008); doi: 10.1117/12.804018
Show Author Affiliations
Eric S. Bailey, Univ. of Wisconsin, Platteville (United States)
Nicholas R. Confer, Univ. of Wisconsin, Platteville (United States)
Vanessa Lutzke, Univ. of Wisconsin, Platteville (United States)
Dana Drochner, Univ. of Wisconsin, Platteville (United States)
Kyle Vircks, Univ. of Wisconsin, Platteville (United States)
James P. Hamilton, Univ. of Wisconsin, Platteville (United States)
Photonic Cleaning Technologies, LLC (United States)

Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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