Share Email Print
cover

Proceedings Paper

Photoluminescence properties of rare-earth doped Si-based films materials
Author(s): Qingnian Wang; Meiling Yuan; Xinli Leng
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The photoluminescence (PL) spectra at room temperature for the silicon-based samples doped by Nd by ion implantation are measured. The results show that all the samples possess blue-violet photoluminescence properties under the ultraviolet light excitation and its light emission is stable. The intensity of PL spectra is closely relative to the dose of implantation and to the temperature of thermal annealing.The above samples were treated by anodization method. The PL spectra of porous samples which were treated by HNO3 were measured. The results show light emission efficiency of the porous samples that were treated by electro-chemical anodization etch and HNO3 is higher than those of ordinary PS samples under the same measuring conditions.

Paper Details

Date Published: 18 November 2008
PDF: 4 pages
Proc. SPIE 7135, Optoelectronic Materials and Devices III, 71353D (18 November 2008); doi: 10.1117/12.803073
Show Author Affiliations
Qingnian Wang, Nanchang Univ. (China)
Meiling Yuan, Nanchang Univ. (China)
Xinli Leng, Nanchang Univ. (China)


Published in SPIE Proceedings Vol. 7135:
Optoelectronic Materials and Devices III
Yi Luo; Jens Buus; Fumio Koyama; Yu-Hwa Lo, Editor(s)

© SPIE. Terms of Use
Back to Top