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Proceedings Paper

Analysis of a new measurement for electromagnetic field with the DGD of fiber grating
Author(s): Yang Su; Hui Peng; Yuquan Li
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Paper Abstract

Fiber grating is sensitive to the stress, temperature and other entironmental factors. It has caused much attention and has been used widely. In this paper a new magnetic field measurement using different group delay (DGD) of fiber grating is proposed. When the magnetic field applied the refractive index difference of the two circularly polarized light in fiber grating will be changed because of the faraday effect. So the DGD of fiber grating is changed. Through the formula derivation in certain condition, the linear relationship between the peak value of DGD and magnetic field in measurement range is found. Through the simulations the effect of applied magnetic field, fiber length and index modulation coefficient on the peak value of DGD is shown. On the other hand, the linearity will tend to saturation when magnetic field exceed the measurement range. So we can determine the mesurement range given design parameters. In the experiments the DGD of FBG without and with magnetic field are performed. The peak value of DGD increases with the applied magnetic field linearly. The fit curve of experimental and simulated results is parallel approximately and the gap is because of the intrinsic DGD of fiber grating. Using the optical vector analyzer with precision of 10-5ps we get the sensitivity of 0.001Gs in experiment. The simulations and experiments validate this method.

Paper Details

Date Published: 11 November 2008
PDF: 7 pages
Proc. SPIE 7134, Passive Components and Fiber-based Devices V, 71343Y (11 November 2008); doi: 10.1117/12.802960
Show Author Affiliations
Yang Su, The PLA Univ. of Science and Technology (China)
Hui Peng, The PLA Univ. of Science and Technology (China)
Yuquan Li, The PLA Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7134:
Passive Components and Fiber-based Devices V
Ming-Jun Li; Ping Shum; Ian H. White; Xingkun Wu, Editor(s)

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