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Proceedings Paper

The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array
Author(s): Xiqu Chen
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Paper Abstract

The readout integrated circuit (ROIC) for micro-bolometric infrared focal plane array (IRFPA) is commonly fabricated in silicon complementary metal oxide semiconductor field effect transistor (CMOS) technology. There are three main categories of noise in a typical CMOS ROIC, which are 1/f noise, KTC noise and fixed pattern noise. These noises in CMOS ROIC can seriously restrain the dynamic range of the ROIC and degrade the performance of IRFPA. A new CMOS ROIC for micro-bolometric IRFPA is designed to suppress the noises, and its performance is successfully verified through the theory analysis and experimental results in this paper.

Paper Details

Date Published: 18 November 2008
PDF: 8 pages
Proc. SPIE 7135, Optoelectronic Materials and Devices III, 713539 (18 November 2008); doi: 10.1117/12.802939
Show Author Affiliations
Xiqu Chen, Wuhan Polytechnic Univ. (China)


Published in SPIE Proceedings Vol. 7135:
Optoelectronic Materials and Devices III
Yi Luo; Jens Buus; Fumio Koyama; Yu-Hwa Lo, Editor(s)

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