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Proceedings Paper

Total internal reflection type echelle grating demultiplexer based on amorphous silicon nanowire platform
Author(s): Ning Zhu; Jun Song; Lech Wosinski; Sailing He
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Paper Abstract

In this paper we present measurement results of an ultracompact echelle-grating demultiplexer based on silicon-on-insulator nanowire platform, in which we introduced a total internal reflection design of the grating facets to improve the diffraction efficiency. An average increase of the diffraction efficiency with 3.7dB is observed for the 3 channels compared to a normal design.

Paper Details

Date Published: 11 November 2008
PDF: 9 pages
Proc. SPIE 7134, Passive Components and Fiber-based Devices V, 71340V (11 November 2008); doi: 10.1117/12.802558
Show Author Affiliations
Ning Zhu, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)
Jun Song, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)
Lech Wosinski, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)
Sailing He, The Royal Institute of Technology (Sweden)
Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7134:
Passive Components and Fiber-based Devices V
Ming-Jun Li; Ping Shum; Ian H. White; Xingkun Wu, Editor(s)

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