Share Email Print

Proceedings Paper

Managing contamination-enhanced Laser Induced Damage (CLID)
Author(s): Randy M. Villahermosa; Bruce H. Weiller; Shabnam Virji; David P. Taylor
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Contamination-enhanced Laser Induced Damage (CLID) occurs when molecular or particulate contamination, present on or in the vicinity of an optical material, leads to accelerated laser power degradation and premature failure. The physical mechanisms that cause CLID are not sufficiently understood to predict the extent to which a contaminant will cause damage. Although standard computational methods can be used to predict the amount of contamination on an optic, the effects of those molecules or particles on laser performance has not been sufficiently quantified. This paper will describe an approach for managing CLID that relies on laboratory studies to understand the relationship between contaminant type or quantity and CLID thresholds. That insight can then be used to guide the definition of cleanliness requirements and the design of material screening tests. Initial efforts to study how mass transport, the movement of contaminants in and out of the laser beam, affects damage rates will be discussed as well.

Paper Details

Date Published: 2 September 2008
PDF: 9 pages
Proc. SPIE 7069, Optical System Contamination: Effects, Measurements, and Control 2008, 706908 (2 September 2008); doi: 10.1117/12.802313
Show Author Affiliations
Randy M. Villahermosa, The Aerospace Corp. (United States)
Bruce H. Weiller, The Aerospace Corp. (United States)
Shabnam Virji, The Aerospace Corp. (United States)
David P. Taylor, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 7069:
Optical System Contamination: Effects, Measurements, and Control 2008
Sharon A. Straka, Editor(s)

© SPIE. Terms of Use
Back to Top