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Proceedings Paper

Optical differential evanesent investigation of nanometric dielectric materials morphology on waveguides
Author(s): Simona Popescu; Nina Mirchin; Igor Lapsker; Petru V. Notingher; Ion Mihailescu; Aaron Peled
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Paper Abstract

In this work, nanometer thickness dielectric layers deposited from colloid solutions using irradiation with Short Wavelength (SW) in the visible domain have been investigated by the Differential Evanescent Light Intensity (DELI) method. A high intensity UV filtered irradiation lamp was used for photodepositing nano-layers, directly on glass substrates serving as waveguides. The amorphous Selenium (a-Se) nanometric thin layers were deposited as circular zones of about ~ 1 cm2 area. Polypropylene and Polyethylene compounds melted on glass waveguides were also analyzed by DELI.

Paper Details

Date Published: 29 April 2008
PDF: 7 pages
Proc. SPIE 7007, INDLAS 2007: Industrial Laser Applications, 700708 (29 April 2008); doi: 10.1117/12.801932
Show Author Affiliations
Simona Popescu, Politehnica Univ. of Bucharest (Romania)
Nina Mirchin, Holon Institute of Technology (Israel)
Igor Lapsker, Holon Institute of Technology (Israel)
Petru V. Notingher, Politehnica Univ. of Bucharest (Romania)
Ion Mihailescu, National Institute for Lasers (Romania)
Aaron Peled, Holon Institute of Technology (Israel)


Published in SPIE Proceedings Vol. 7007:
INDLAS 2007: Industrial Laser Applications

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