Share Email Print

Proceedings Paper

Modeling EUVL illumination systems
Author(s): Daniel G. Smith
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As first generation extreme ultraviolet lithography (EUVL) systems go into the hands of lithographers, the obstacles to full production are reducing in number and scope. Chief among these remaining obstacles, however, is the source power. Although source manufacturers have made remarkable recent progress, power levels are still far below what is needed for production tools. This makes the importance of an efficient illumination system even more so as Moore's law pushes the industry to resolutions requiring EUVL. This paper describes some of the special issues for EUVL illumination systems, discusses several modeling tools appropriate to EUVL illumination systems, with examples based on fly's eye and debris mitigation systems found in the literature.

Paper Details

Date Published: 23 September 2008
PDF: 8 pages
Proc. SPIE 7103, Illumination Optics, 71030B (23 September 2008); doi: 10.1117/12.801688
Show Author Affiliations
Daniel G. Smith, Nikon Research Corp. of America (United States)

Published in SPIE Proceedings Vol. 7103:
Illumination Optics
Tina E. Kidger; Stuart R. David, Editor(s)

© SPIE. Terms of Use
Back to Top