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Proceedings Paper

Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures
Author(s): Oleg G. Morozov; Oleg G. Natanson; Dmitry L. Aybatov; Anvar A. Talipov; Vitalii P. Prosvirin; Alexei S. Smirnov
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Paper Abstract

In paper metrological aspects of symmetric double frequency and multi frequency reflectometry for Bragg structures are considered. Basics of this method is amplitude phase conversion of coherent single frequency radiation to double frequency and its distinguished features are frequency-shifted spectral components symmetrical position relatively suppressed frequency of initial radiation, high level of spectral purity, stable output radiation, and high conversion ratio. In paper are considered the metrological aspects of following systems: a) symmetric multi frequency reflectometry system for Bragg structures control, and b) symmetric double frequency reflectometry system for Bragg structures.

Paper Details

Date Published: 2 May 2008
PDF: 6 pages
Proc. SPIE 7026, Optical Technologies for Telecommunications 2007, 70260J (2 May 2008); doi: 10.1117/12.801507
Show Author Affiliations
Oleg G. Morozov, Kazan State Technical Univ. (Russia)
Oleg G. Natanson, JSC Tattelecom (Russia)
Dmitry L. Aybatov, Kazan State Technical Univ. (Russia)
Anvar A. Talipov, Kazan State Technical Univ. (Russia)
Vitalii P. Prosvirin, Kazan State Technical Univ. (Russia)
Alexei S. Smirnov, Kazan State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 7026:
Optical Technologies for Telecommunications 2007

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