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Proceedings Paper

APD imaging probe for tritium surface contamination
Author(s): Richard A. Myers; Richard Farrell; Frank Robertson; David Dogruel; R. Scott Willms
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Paper Abstract

We report on the development of a practical, easy-to-use, multi-element, solid-state instrument for detecting and imaging tritium contamination on surfaces. The innovation, which enables this instrumentation, relies on cutting-edge silicon avalanche photodiode (APD) array detector technology to provide an effective coverage area without compromising the overall sensitivity. We discuss the design and assembly of a prototype unit to monitor a surface area of over 900 mm2 while maintaining a spatial resolution of less than 4 mm. During tests at Los Alamos National Laboratories, we demonstrated tritium counting efficiencies of over 40% and established that this unit can be used to expedite established testing procedures by locating areas of potential activity or when combined with established swipe analysis.

Paper Details

Date Published: 3 September 2008
PDF: 11 pages
Proc. SPIE 7080, Penetrating Radiation Systems and Applications IX, 70800C (3 September 2008); doi: 10.1117/12.800763
Show Author Affiliations
Richard A. Myers, Radiation Monitoring Devices, Inc. (United States)
Richard Farrell, Radiation Monitoring Devices, Inc. (United States)
Frank Robertson, Radiation Monitoring Devices, Inc. (United States)
David Dogruel, Los Alamos National Lab. (United States)
R. Scott Willms, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 7080:
Penetrating Radiation Systems and Applications IX
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Richard C Schirato, Editor(s)

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