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Proceedings Paper

Detection of concealed explosives at stand-off distances using wide band swept millimetre waves
Author(s): David A. Andrews; Nacer D. Rezgui; Sarah E. Smith; Nicholas Bowring; Matthew Southgate; John G. Baker
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Paper Abstract

Millimetre waves in the range 20 to 110 GHz have been used to detect the presence and thickness of dielectric materials, such as explosives, by measuring the frequency response of the return signal. Interference between the reflected signals from the front and back surfaces of the dielectric provides a characteristic frequency variation in the return signal, which may be processed to yield its optical depth [Bowring et al, Meas. Sci. Technol. 19, 024004 (2008)]. The depth resolution depends on the sweep bandwidth, which is typically 10 to 30 GHz. By using super-heterodyne detection the range of the object can also be determined, which enables a signal from a target, such as a suicide bomber to be extracted from background clutter. Using millimetre wave optics only a small area of the target is illuminated at a time, thus reducing interference from different parts of a human target. Results are presented for simulated explosive materials with water or human backing at stand-off distances. A method of data analysis that involves pattern recognition enables effective differentiation of target types.

Paper Details

Date Published: 2 October 2008
PDF: 9 pages
Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170J (2 October 2008); doi: 10.1117/12.800382
Show Author Affiliations
David A. Andrews, Manchester Metropolitan Univ. (United Kingdom)
Nacer D. Rezgui, Manchester Metropolitan Univ. (United Kingdom)
Sarah E. Smith, Manchester Metropolitan Univ. (United Kingdom)
Nicholas Bowring, Manchester Metropolitan Univ. (United Kingdom)
Matthew Southgate, Manchester Metropolitan Univ. (United Kingdom)
John G. Baker, Manchester Metropolitan Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 7117:
Millimetre Wave and Terahertz Sensors and Technology
Keith A. Krapels; Neil A. Salmon, Editor(s)

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