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Proceedings Paper

Untangling the make-up of the NIR reflectance peak in coastal waters and its impact on remote sensing retrievals of [Chl] and fluorescence height algorithms
Author(s): S. Ahmed; A. Gilerson; J. Zhou; R. Dyer; S. Hlaing; I. Ioannou; B. Gross; F. Moshary
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Paper Abstract

Recent studies show that the contribution of the chlorophyll fluorescence component to the NIR reflectance is significant only for relatively low concentrations of minerals; furthermore, Fluorescence Line Height (FLH) algorithms do not work properly for [Chl] > 5-10 mg/m3 because of the deviation of elastic reflectance from the baseline. But even for relatively low chlorophyll concentration [Chl] values the relationship between FLH and [Chl] is affected by several factors which should be taken into account. The sensitivity of this relationship to atmospheric correction schemes, incident and viewing angles and chlorophyll retrieval algorithms are analyzed, and a special correlation procedure is developed to minimize these effects. Effective fluorescence quantum yield distributions retrieved from field measurements and satellite imagery are also compared with the previously indirectly estimated values based on the analysis of the shift of the observed NIR reflectance peak from the fluorescence peak at 685 nm.

Paper Details

Date Published: 13 October 2008
PDF: 11 pages
Proc. SPIE 7105, Remote Sensing of the Ocean, Sea Ice, and Large Water Regions 2008, 710508 (13 October 2008); doi: 10.1117/12.800378
Show Author Affiliations
S. Ahmed, City College, CUNY (United States)
A. Gilerson, City College, CUNY (United States)
J. Zhou, City College, CUNY (United States)
R. Dyer, City College, CUNY (United States)
S. Hlaing, City College, CUNY (United States)
I. Ioannou, City College, CUNY (United States)
B. Gross, City College, CUNY (United States)
F. Moshary, City College, CUNY (United States)

Published in SPIE Proceedings Vol. 7105:
Remote Sensing of the Ocean, Sea Ice, and Large Water Regions 2008
Charles R. Bostater; Stelios P. Mertikas; Xavier Neyt; Miguel Velez-Reyes, Editor(s)

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