Share Email Print
cover

Proceedings Paper

Thermal infrared optical metrology using quadri-wave lateral shearing interferometry
Author(s): Sabrina Velghe; Djamel Brahmi; William Boucher; Benoit Wattellier; Nicolas Guérineau; Riad Haïdar; Jérôme Primot
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique, to characterize thermal infrared lenses for wavelengths within 8 and 14μm. Wave front sensing is not only a tool to quantify optical quality, but also to map the local (dust, scratches) or global possible defects. This method offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. Moreover thanks to the acceptance of QWLSI to high numerical aperture beams, no additional optics is required. This makes lens characterization convenient and very fast. We particularly show the experimental characterization of single Germanium lens and finally present the characterization of complex optical imaging systems for high-performance infrared cameras. The analysis is made in conditions that are very close to the usual conditions of the camera use; that is to say, directly in the convergent beam and in polychromatic (black body) light.

Paper Details

Date Published: 2 October 2008
PDF: 8 pages
Proc. SPIE 7113, Electro-Optical and Infrared Systems: Technology and Applications V, 71130X (2 October 2008); doi: 10.1117/12.800325
Show Author Affiliations
Sabrina Velghe, PHASICS S.A. (France)
Djamel Brahmi, PHASICS S.A. (France)
William Boucher, PHASICS S.A. (France)
Benoit Wattellier, PHASICS S.A. (France)
Nicolas Guérineau, ONERA, Office National d'Etudes et de Recherches Aérospatiales (France)
Riad Haïdar, ONERA, Office National d'Etudes et de Recherches Aérospatiales (France)
Jérôme Primot, ONERA, Office National d'Etudes et de Recherches Aérospatiales (France)


Published in SPIE Proceedings Vol. 7113:
Electro-Optical and Infrared Systems: Technology and Applications V
David A. Huckridge; Reinhard R. Ebert, Editor(s)

© SPIE. Terms of Use
Back to Top