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Proceedings Paper

Material scanner in the submillimetre-wave region: configuration and signal processing
Author(s): C. Krebs; S. Schneider; A. Hommes; D. Nüßler
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Paper Abstract

The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.

Paper Details

Date Published: 2 October 2008
PDF: 6 pages
Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170F (2 October 2008); doi: 10.1117/12.800225
Show Author Affiliations
C. Krebs, RheinAhrCampus (Germany)
S. Schneider, Research Institute for High Frequency Physics and Radar Techniques (Germany)
A. Hommes, Research Institute for High Frequency Physics and Radar Techniques (Germany)
D. Nüßler, Research Institute for High Frequency Physics and Radar Techniques (Germany)


Published in SPIE Proceedings Vol. 7117:
Millimetre Wave and Terahertz Sensors and Technology
Keith A. Krapels; Neil A. Salmon, Editor(s)

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