Share Email Print

Proceedings Paper

Optical compensation of macroscopical surface curvature in rough surface scatterometry
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

While scatterometry of macroscopically plane rough surfaces by using quasi-parallel illumination is widely investigated, measuring light scatter from rough surfaces with a certain macroscopical curvature leads to the problem of separating the effects of micro-roughness from those of curvature in the scatter distribution. This is especially true for micro-roughness far beyond the smooth surface criterion. So for example, the scatter distribution of a cylinder with heavy traces of machining along a plane through the axis of rotation will be wide-spread perpendicularly to that plane for both reasons, the scatter pattern of the machining marks and the curvature of the surface. The curvature can be compensated by means of additional aspherical optical systems. In principal, this can be achieved by adaption of the illumination system or the receiver optics. Also both ways can be applied. The current paper deals with various design approaches theoretically and practically and gives some comparative measurement examples from actual applications for compensated and uncompensated systems.

Paper Details

Date Published: 25 September 2008
PDF: 10 pages
Proc. SPIE 7102, Optical Fabrication, Testing, and Metrology III, 71020Z (25 September 2008); doi: 10.1117/12.799065
Show Author Affiliations
Cornelius Hahlweg, Helmut Schmidt Univ. (Germany)
Hendrik Rothe, Helmut Schmidt Univ. (Germany)

Published in SPIE Proceedings Vol. 7102:
Optical Fabrication, Testing, and Metrology III
Angela Duparré; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top