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Proceedings Paper

Angle-dependent infrared reflectance measurements in support of VIIRS
Author(s): Simon G. Kaplan; Enrique J. Iglesias; Leonard M. Hanssen
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Paper Abstract

We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 μm to 20 μm wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 μm to 5 μm and a 12 K Si:As BIB detector from 2 μm to 20 μm. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiOx-coated Ag mirrors to assess their performance for such applications as the half-angle mirror (HAM) in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles of incidence from 10° to 65° and wavelengths between 3 μm and 13 μm.

Paper Details

Date Published: 3 September 2008
PDF: 10 pages
Proc. SPIE 7082, Infrared Spaceborne Remote Sensing and Instrumentation XVI, 70820X (3 September 2008); doi: 10.1117/12.798263
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Enrique J. Iglesias, National Institute of Standards and Technology (United States)
Leonard M. Hanssen, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 7082:
Infrared Spaceborne Remote Sensing and Instrumentation XVI
Marija Strojnik, Editor(s)

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