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Proceedings Paper

Distortion mapping correction in aspheric null testing
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Paper Abstract

We describe methods to correct both symmetric and asymmetric distortion mapping errors induced by null testing elements such as holograms or null lenses. We show experimental results for direct measurement and correction of symmetric mapping distortion, as well as an example result for analytical mapping performed using an orthogonal set of vector polynomials for asymmetric correction. The empirical determination of symmetric distortion is made via calculation from predicted and measured changes to aberrations induced via known changes to the testing point.

Paper Details

Date Published: 11 August 2008
PDF: 8 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706313 (11 August 2008); doi: 10.1117/12.798151
Show Author Affiliations
M. Novak, College of Optical Sciences, The Univ. of Arizona (United States)
C. Zhao, College of Optical Sciences, The Univ. of Arizona (United States)
J. H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)

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