Share Email Print
cover

Proceedings Paper

Metrology at the nanoscale: what are the grand challenges?
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Nanometrology provides the means to measure and characterize nanometer scale process and product performance and covers an expanse of topics including instrumentation, measurement methods (off-line and in-process applications), and standards. To meet the needs of the emerging integrated manufacturing community it is important that research on scale-up of nanotechnology for high-rate production, reliability, robustness, yield, efficiency and cost issues for manufactured products and services be pursued. To achieve this, new research directions must include a systems approach that encompasses the characterization of instrumentation, three dimensional metrology, and production-hardened metrology. To illustrate the value of metrology and the role of standards to facilitate product realization, a number of National Nanotechnology Initiative (NNI) sponsored workshops have been organized. This paper provides an overview of some key findings and recommendations identified at two nanomanufacturing workshops held in 2004 and 2006 that were focused on metrology, instrumentation, and standards.

Paper Details

Date Published: 9 September 2008
PDF: 13 pages
Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 704202 (9 September 2008); doi: 10.1117/12.798004
Show Author Affiliations
Kevin W. Lyons, National Institute of Standards and Technology (United States)
Michael T. Postek, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 7042:
Instrumentation, Metrology, and Standards for Nanomanufacturing II
Michael T. Postek; John A. Allgair, Editor(s)

© SPIE. Terms of Use
Back to Top