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Proceedings Paper

PICASSO: an end-to-end image simulation tool for space and airborne imaging systems
Author(s): Steve A. Cota; Jabin T. Bell; Richard H. Boucher; Tracy E. Dutton; Chris J. Florio; Geoffrey A. Franz; Thomas J. Grycewicz; Linda S. Kalman; Robert A. Keller; Terrence S. Lomheim; Diane B. Paulson; Timothy S. Willkinson
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Paper Abstract

The design of any modern imaging system is the end result of many trade studies, each seeking to optimize image quality within real world constraints such as cost, schedule and overall risk. Image chain analysis - the prediction of image quality from fundamental design parameters - is an important part of this design process. At The Aerospace Corporation we have been using a variety of image chain analysis tools for many years, the Parameterized Image Chain Analysis & Simulation SOftware (PICASSO) among them. In this paper we describe our PICASSO tool, showing how, starting with a high quality input image and hypothetical design descriptions representative of the current state of the art in commercial imaging satellites, PICASSO can generate standard metrics of image quality in support of the decision processes of designers and program managers alike.

Paper Details

Date Published: 25 August 2008
PDF: 31 pages
Proc. SPIE 7087, Remote Sensing System Engineering, 708703 (25 August 2008); doi: 10.1117/12.797988
Show Author Affiliations
Steve A. Cota, The Aerospace Corp. (United States)
Jabin T. Bell, The Aerospace Corp. (United States)
Richard H. Boucher, The Aerospace Corp. (United States)
Tracy E. Dutton, The Aerospace Corp. (United States)
Chris J. Florio, The Aerospace Corp. (United States)
Geoffrey A. Franz, The Aerospace Corp. (United States)
Thomas J. Grycewicz, The Aerospace Corp. (United States)
Linda S. Kalman, The Aerospace Corp. (United States)
Robert A. Keller, The Aerospace Corp. (United States)
Terrence S. Lomheim, The Aerospace Corp. (United States)
Diane B. Paulson, The Aerospace Corp. (United States)
Timothy S. Willkinson, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 7087:
Remote Sensing System Engineering
Philip E. Ardanuy; Jeffery J. Puschell, Editor(s)

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