Share Email Print
cover

Proceedings Paper

Standardization of noncontact 3D measurement
Author(s): Toshiyuki Takatsuji; Sonko Osawa; Osamu Sato
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As the global R&D competition is intensified, more speedy measurement instruments are required both in laboratories and production process. In machinery areas, while contact type coordinate measuring machines (CMM) have been widely used, noncontact type CMMs are growing its market share which are capable of measuring enormous number of points at once. Nevertheless, since no industrial standard concerning an accuracy test of noncontact CMMs exists, each manufacturer writes the accuracy of their product according to their own rules, and this situation gives confusion to customers. The working group ISO/TC 213/WG 10 is trying to make a new ISO standard which stipulates an accuracy test of noncontact CMMs. The concept and the situation of discussion of this new standard will be explained. In National Metrology Institute of Japan (NMIJ), we are collecting measurement data which serves as a technical background of the standards together with a consortium formed by users and manufactures. This activity will also be presented.

Paper Details

Date Published: 29 August 2008
PDF: 8 pages
Proc. SPIE 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI, 706602 (29 August 2008); doi: 10.1117/12.797968
Show Author Affiliations
Toshiyuki Takatsuji, National Metrology Institute of Japan, AIST (Japan)
Sonko Osawa, National Metrology Institute of Japan, AIST (Japan)
Osamu Sato, National Metrology Institute of Japan, AIST (Japan)


Published in SPIE Proceedings Vol. 7066:
Two- and Three-Dimensional Methods for Inspection and Metrology VI
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)

© SPIE. Terms of Use
Back to Top