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Proceedings Paper

Resonant gratings for narrow band pass filtering applications
Author(s): Olga Boyko; Fabien Lemarchand; Anne Talneau; Anne-Laure Fehrembach; Anne Sentenac
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Paper Abstract

A resonant grating filter can be basically described as a sub-wavelength grating inscribed on a a planar waveguide made of dielectric thin film layers. The reflectivity of such a structure presents some peaks versus the wavelength that are generated by the coupling and coupling out of different modes of the waveguide. These peaks can be tailored in order to create free-space narrow bandpass inverse (notch) filters, with a very sharp spectral response (typically a spectral bandwidth below 0.5 reflectance nm for a component working at 1550nm). We show an experimental demonstration of a high performances resonant grating filter working in reflectance under a given incidence and wavelength. This filter presents simultaneously a good angular tolerance and polarization independence with a full width at half maximum about 0.4nm. The dielectric stack reflectance configuration is chosen so that the coupling conditions for two TE reflectance guided modes are simultaneously satisfied. Moreover, the grating cell presents a complex structure of four holes with different diameters, optimized for increasing the angular tolerance of the filter while maintaining a narrow spectral width for any polarization. Comparisons with theoretical calculations are provided.

Paper Details

Date Published: 25 September 2008
PDF: 9 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 71011B (25 September 2008); doi: 10.1117/12.797655
Show Author Affiliations
Olga Boyko, Lab. de Photonique et Nanostructures, CNRS (France)
Fabien Lemarchand, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
Anne Talneau, Lab. de Photonique et Nanostructures, CNRS (France)
Anne-Laure Fehrembach, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
Anne Sentenac, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)

Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

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