Share Email Print

Proceedings Paper

Light scattering to isolate a single interface within a multilayer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Light scattering is a current tool for characterization of defects in optical interferential coatings. However, this tool is not fully efficient for multilayer component. Indeed, in this case, the scattered light from multilayers originates from several interface roughnesses that cannot be separated a priori. In this paper, a technique which can isolate a single interface embedded within a stack is presented. It is based on destructive interferences between the polarization modes of the angular scattering. These interferences can be tuned in a selective way that allows the extraction of light issued from a specific scattering interface.

Paper Details

Date Published: 25 September 2008
PDF: 10 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 71010V (25 September 2008); doi: 10.1117/12.797634
Show Author Affiliations
Gaëlle Georges, Institut Fresnel, Domaine Univ. de Saint Jérôme (France)
Carole Deumié, Institut Fresnel, Domaine Univ. de Saint Jérôme (France)
Claude Amra, Institut Fresnel, Domaine Univ. de Saint Jérôme (France)

Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

© SPIE. Terms of Use
Back to Top