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Proceedings Paper

Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements
Author(s): Peter Blake; Perry Greenfield; Warren Hack; J. Todd Miller; Ivo Busko; Babak Saif; Bente Eegholm; Ritva Keski-Kuha; Marcel Bluth
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Paper Abstract

The Spatially Phase Shifted Digital Speckle Pattern Interferometer (SPS-DSPI) is a speckle pattern interferometer in which the four phase-shifted interferograms are captured simultaneously in a single image. Designed to measure thermal distortions of large matte-surfaced structures for the James Webb Space Telescope (JWST) program, this metrology instrument has been used in two major cryo-distortion tests. This report will describe how differences in the vibrational motions of the test objects necessitated changes in basic algorithms. The authors also report operational upgrades, quantification of uncertainty, and improvement of the software operability with a graphic interface. Results from the tests of the JWST test structures are discussed as illustration.

Paper Details

Date Published: 11 August 2008
PDF: 13 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706306 (11 August 2008); doi: 10.1117/12.797467
Show Author Affiliations
Peter Blake, NASA Goddard Space Flight Ctr. (United States)
Perry Greenfield, Space Telescope Science Institute (United States)
Warren Hack, Space Telescope Science Institute (United States)
J. Todd Miller, Space Telescope Science Institute (United States)
Ivo Busko, Space Telescope Science Institute (United States)
Babak Saif, Space Telescope Science Institute (United States)
Bente Eegholm, Space Telescope Science Institute (United States)
Ritva Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)
Marcel Bluth, ATK Spacecraft Systems (United States)


Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)

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