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Proceedings Paper

Characterization of the optical constants of materials from the visible to the soft x-rays
Author(s): Juan I. Larruquert; Mónica Fernández-Perea; Manuela Vidal-Dasilva; José A. Aznárez; José A. Méndez; Luca Poletto; Denis Garoli; A. Marco Malvezzi; Angelo Giglia; Stefano Nannarone
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Paper Abstract

A summary of the research performed on the optical characterization of Sc and of several lanthanides from the visible to the soft x-rays is presented. The low absorption of these materials mainly below the O2,3 edge (L2,3 edge for Sc) turns them promising materials for the realization of multilayer mirrors in a spectral range in which most materials in nature absorb strongly. Thin-film samples with several thicknesses of the target material were deposited by evaporation over thin-film substrates in UHV, and their transmittance was measured in situ. A wide spectral range of direct characterization, along with extrapolations to longer and shorter wavelengths either using literature data (when available) or model predictions, enabled the development of consistent optical constants over the whole spectrum. An assortment of consistency sum rules has been used, and it was found that each of them highlights a given spectral range, which may help evaluate the consistency of each part of the combined spectrum.

Paper Details

Date Published: 25 September 2008
PDF: 11 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 71010W (25 September 2008); doi: 10.1117/12.797419
Show Author Affiliations
Juan I. Larruquert, GOLD - Instituto de Física Aplicada - CSIC (Spain)
Mónica Fernández-Perea, GOLD - Instituto de Física Aplicada - CSIC (Spain)
Manuela Vidal-Dasilva, GOLD - Instituto de Física Aplicada - CSIC (Spain)
José A. Aznárez, GOLD - Instituto de Física Aplicada - CSIC (Spain)
José A. Méndez, GOLD - Instituto de Física Aplicada - CSIC (Spain)
Luca Poletto, Istituto Nazionale per la Fisica della Materia-CNR (Italy)
Dept. of Information Engineering (Italy)
Denis Garoli, Istituto Nazionale per la Fisica della Materia-CNR (Italy)
Dept. of Information Engineering (Italy)
A. Marco Malvezzi, Univ. di Pavia (Italy)
CNISM (Italy)
Angelo Giglia, Lab. TASC-INFM-CNR (Italy)
Stefano Nannarone, Lab. TASC-INFM-CNR (Italy)
Univ. di Modena e Reggio Emilia (Italy)


Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

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