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Proceedings Paper

Optical vortex metrology: Are phase singularities foes or friends in optical metrology?
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Paper Abstract

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.

Paper Details

Date Published: 22 April 2008
PDF: 8 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081G (22 April 2008); doi: 10.1117/12.797345
Show Author Affiliations
Mitsuo Takeda, The Univ. of Electro-Communications (Japan)
Wei Wang, The Univ. of Electro-Communications (Japan)
Steen G. Hanson, Technical Univ. of Denmark (Denmark)
Yoko Miyamoto, The Univ. of Electro-Communications (Japan)


Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics

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